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激光粒度分析仪测量下限解读

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激光粒度仪测量粒度的原理是米氏散射理论。米氏散射理论用数学语言精确地描述了折射率为n、吸收率为m的特定物质的粒径为d的球形颗粒,在波长为A单色光照射下,散射光强度随散射角变化呈空间分布函数,此函数也称为散射谱。根据米氏散射理论可以得出颗粒越大,前向散射越强而后向散射越弱;随着颗粒粒径的减小前向散射迅速减弱而后向散射逐渐增强。

图2是以波长为尺度的大、中、小颗粒的散射谱示意图。激光粒度仪正是通过设置在不同散射角度的光电探测器阵列,测试颗粒的散射光强分布(在极坐标下),由此确定颗粒粒径的大小。这种散射谱对于特定颗粒在空间具有稳定分布的特征,因此称此种原理的仪器为静态激光粒度仪。当颗粒粒径小到一定程度(波长的1/10左右)时,光强分布变成了两个相互有重叠的圆。当颗粒非常小时,则前向圆和后向圆完全对称(此时称为瑞利散射)。所以当粒径为dm的颗粒,其散射光强分布与非常小颗粒的散射光强分布相似,以至不能被光电探测器阵列及后续的信号处理电路所分辨,则认为dm就是激光粒度仪的测量下限。

此极限还与激光波长有关,研究表明,红光635nm波长的激光粒度仪的测量极限为30mm,而蓝光405nm波长的激光粒度分析仪仪的测量极限为10mm。理论上,静态激光粒度仪欲分辨纳米级的颗粒至少需要两个条件:(1)具有测量后向散射的光电探测器阵列;(2)需要用波长更短的激光器。在可见光的范内,10-30nm是静态激光粒度仪的测量下限。

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